Inverted Metallurgical Microscope LB-70IUM Catalog

Labotronics Inverted Metallurgical Microscope LB-70IUM features an infinite optical system, a 30° inclined trinocular head, and a WF10X/22 mm wide-field eyepiece. Its 50X metallurgical objective has an NA of 0.55 and a 10.0 mm working distance, with coaxial coarse and fine focusing. Multimode bright-field, dark-field, and polarizing observation support detailed specimen examination.

Optical System	Infinite optical system
Viewing Head	30° inclined trinocular tube
Interpupillary Distance	48–76 mm
Splitting Ratio	Eyepiece : Trinocular = 100:0 or 20:80
Eyepiece	WF10X/22 mm, adjustable
Reticle Eyepiece	WF10X/22 mm, adjustable, reticule 0.1 mm
Objective Type	Infinity Long Working Distance Plan Metallurgical Objectives
50X Objective	50X, NA 0.55, WD 10.0 mm
Nosepiece	Quintuple nosepiece
Focusing	Low-position coaxial coarse and fine adjustment
Coarse Stroke	10 mm/rotation
Fine Stroke	0.2 mm/rotation
Fine Division	2 μm
Stage Size	210 × 180 mm
Stage Moving Range	50 × 50 mm
Stage Scale	0.1 mm
Round Slide Size	Ø110 mm
Illumination	12V/50W halogen lamp
Input Voltage	100–240V
Polarizing Kit	Polarizer and analyzer
Standard Filter	Blue filter, Ø34 mm
Video Adapter Options	0.35X, 0.5X, 0.75X, 1X C-mount adapters
Digital Eyepiece Interface	Trinocular digital eyepiece interface
Packaging Dimensions	65x61x34cm
Net Weight	17 kg
Gross Weight	18 kg

• Dark-field objectives support both dark-field and bright-field observation.
• The wide-field eyepiece provides a field of view of up to 22 mm.
• The 12V/50W halogen lamp provides high-intensity illumination.
• Metallurgical objectives support bright-field and bright/dark field observation.
• The three-layer working stage provides a stable platform for specimen positioning.
• The trinocular viewing head supports 100:0 and 80:20 light distribution.
• It includes a standard polarizing set.

4K HDMI microscope Camera

Inverted Metallurgical Microscope LB-70IUM is used for metallographic analysis, semiconductor silicon wafer inspection, and geological mineral analysis. The microscope supports bright-field, dark-field, and polarized observation for examining metal and material samples.