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Metallurgical Microscope LB-30MUM Catalog

Overview

Metallurgical Microscope LB-30MUM features an infinite optical system for precise analysis of metal surfaces and structures. It is equipped with a backward quintuple nosepiece for smooth objective switching. It has a 30° inclined Siedentopf binocular head with fine focusing knobs for clear, high-resolution imaging. Our microscope supports polarization and DIC techniques for advanced material structure examination.

Specifications :
Optical System Infinite Optical System
Viewing Head Siedentopf Binocular
Inclination Inclined 30°
Interpupillary Distance 48 to 75 mm
Extra Wide Field Eyepiece WF10 × /22 mm
WF10 × /22 mm with cross hair scale
Infinite Plan Achromatic Objective 5 × /0.12/∞/- (BF&DF), LWD 10 mm
10 × /0.25/∞/- (BF&DF), LWD 10 mm
20 × /0.40/∞/0 (BF&DF), LWD 5.0 mm
50 × /0.75/∞/0 (BF&DF), LWD 1.3 mm
100 × /0.90 (Dry)/∞/0 (BF&DF), LWD 0.7 mm
Nosepiece Backward Quintuple Nosepiece
Focusing Coaxial Coarse & Fine Adjustment
Fine division: 2μm
Moving Range: 30 mm
Stage Double Layer Mechanical Stage: 188 × 148 mm
Moving Range: 78 × 54 mm
Kohler Illumination Reflected 12V/50W Halogen Light
Product Dimension 260 × 400 × 450 mm
Packaging Dimension 510 × 430 × 430 mm
Net Weight 13 kg
Gross Weight 14.5 kg
Features :

  • Kohler illumination system

  • Wide field eyepiece

  • Bright and dark field capability

  • High-contrast optics

  • Trinocular camera port

  • High magnification range

Standard Accessories :

Reflected 12V/50W Halogen Light

Transmitted 12V/20W Halogen Light

Polarizer and Analyzer 

Green, Gray, and Ground Glass Filter

0.5 × Video Adapter with C-Mount 

0.01mm Stage Micrometer 

Optional Accessories :

Specimen Presser

DIC Attachment

Extra Wide Field Eyepiece (EW15 × 16 mm)

Extra Wide Field Eyepiece (EW20 × 12 mm)

Applications :

Metallurgical Microscope LB-30MUM is used for analyzing the structure of metals, alloys, and non-metallic materials. It is widely used in industrial quality control, material science labs, electronics, metallurgy, and semiconductor inspection.

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