Metallurgical Microscope LB-30MUM
Metallurgical Microscope LB-30MUM features an infinite optical system for precise analysis of metal surfaces and structures. It is equipped with a backward quintuple nosepiece for smooth objective switching. It has a 30° inclined Siedentopf binocular head with fine focusing knobs for clear, high-resolution imaging. Our microscope supports polarization and DIC techniques for advanced material structure examination.
$ 6187.5
Download CatalogSpecifications
| Optical System | Infinite Optical System |
| Viewing Head | Siedentopf Binocular |
| Inclination | Inclined 30° |
| Interpupillary Distance | 48 to 75 mm |
| Extra Wide Field Eyepiece | WF10 × /22 mm WF10 × /22 mm with cross hair scale |
| Infinite Plan Achromatic Objective | 5 × /0.12/∞/- (BF&DF), LWD 10 mm 10 × /0.25/∞/- (BF&DF), LWD 10 mm 20 × /0.40/∞/0 (BF&DF), LWD 5.0 mm 50 × /0.75/∞/0 (BF&DF), LWD 1.3 mm 100 × /0.90 (Dry)/∞/0 (BF&DF), LWD 0.7 mm |
| Nosepiece | Backward Quintuple Nosepiece |
| Focusing | Coaxial Coarse & Fine Adjustment Fine division: 2μm Moving Range: 30 mm |
| Stage | Double Layer Mechanical Stage: 188 × 148 mm Moving Range: 78 × 54 mm |
| Kohler Illumination | Reflected 12V/50W Halogen Light |
| Product Dimension | 260 × 400 × 450 mm |
| Packaging Dimension | 510 × 430 × 430 mm |
| Net Weight | 13 kg |
| Gross Weight | 14.5 kg |
Features
Kohler illumination system
Wide field eyepiece
Bright and dark field capability
High-contrast optics
Trinocular camera port
High magnification range
Standard Accessories
Reflected 12V/50W Halogen Light
Transmitted 12V/20W Halogen Light
Polarizer and Analyzer
Green, Gray, and Ground Glass Filter
0.5 × Video Adapter with C-Mount
0.01mm Stage Micrometer
Optional Accessories
Specimen Presser
DIC Attachment
Extra Wide Field Eyepiece (EW15 × 16 mm)
Extra Wide Field Eyepiece (EW20 × 12 mm)
Applications
Metallurgical Microscope LB-30MUM is used for analyzing the structure of metals, alloys, and non-metallic materials. It is widely used in industrial quality control, material science labs, electronics, metallurgy, and semiconductor inspection.
