Scanning Electron Microscope LB-10SEM Catalog

Scanning Electron Microscope LB-10SEM offers up to 1,000,000X magnification and 0.9 nm resolution at 30 kV for high-precision imaging. It features a Schottky field emission electron gun for a stable and intense electron beam. The three-stage magnetic lens system minimizes aberrations and enhances focus. Our microscope includes a low-vacuum mode for imaging non-conductive samples without coating.

Resolution	0.9 nm at 30 kV (Secondary Electron) 2.5 nm at 30 kV 1.5 nm at 30 kV
Magnification	Photo: 1X to 300,000X Display: 1X to 1,000,000X
Accelerating Voltage	200 V to 30 kV
Electron Gun	Schottky field emission electron gun
Sample Chamber	Low-vacuum mode, up to 180 Pa
Camera	Dual cameras (optical navigation + in-bin monitoring)
Objective Lens	Advanced Composite Lens Design
Stage	5-axis Motorized Control X: 110 mm (X-Axis Travel) Y: 110 mm (X-Axis Travel) Z: 1 to 60 mm (X-Axis Travel) T: -5° to 70° (Tilt Travel) R: 360° (Rotation Travel)
Sample Capacity	Max Diameter: 260mm Max Height: 70mm
Detector	Secondary Electron Detector (SED) Backscatter Electron Detector (BSED) Low Vacuum Secondary Electron Detector (LVSED)
Deceleration Technology	Dual deceleration technology (Duo-Dec) Super deceleration technology
Navigation	Optical navigation, gesture quick navigation
Automatic Functions	Auto brightness/contrast, autofocus, auto astigmatism
Dimension	1200 × 1200 × 1800 mm
Packaging Dimension	1400 × 1400 × 2300 mm
Net Weight	1200 kg
Gross Weight	2200 kg

• Composite objective lens design
• Low-vacuum mode for non-conductive samples
• Dual EDS detectors for elemental and crystallographic analysis
• Field analysis for real-world conditions

9 Holes Standard Tray I for standard samples × 1pc

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9 Holes Standard Tray II for sample height 5mm × 1pc

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9 Holes Standard Tray III for sample height 14mm × 1pc

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Standard Tray VI for sample height 20mm × 1pc

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Standard Tray IV (8 Holes) × 1pc

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6 Inches Wafer Tray V × 1pc

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70 Degree Trays VII × 1pc

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19 Holes Tray VIII × 1pc

4 inches Sample Change Cabinet

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8 inches Sample Change Cabinet

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Trajectory Control Ball

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Rotary Control Board

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SDK Software Development Pack

Scanning Electron Microscope LB-10SEM is used for high-resolution imaging in fields like nanotechnology, materials science, biology, and semiconductor analysis. It helps examine surface topography, elemental composition, and microstructures in various industries.

AutoMap Control Software
Substrates Particles Mask-RCNN Analyst Software
ImageTech Post-processing Software
Auto Measure Measuring Software