Scanning Electron Microscope LB-10SEM

Name: Scanning Electron Microscope LB-10SEM
Brand: Labotronics
SKU: LB-10SEM
Rating: 4.8 (504 reviews)

Scanning Electron Microscope LB-10SEM offers up to 1,000,000X magnification and 0.9 nm resolution at 30 kV for high-precision imaging. It features a Schottky field emission electron gun for a stable and intense electron beam. The three-stage magnetic lens system minimizes aberrations and enhances focus. Our microscope includes a low-vacuum mode for imaging non-conductive samples without coating.

$ 445312.5

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Specifications

Resolution	0.9 nm at 30 kV (Secondary Electron) 2.5 nm at 30 kV 1.5 nm at 30 kV
Magnification	Photo: 1X to 300,000X Display: 1X to 1,000,000X
Accelerating Voltage	200 V to 30 kV
Electron Gun	Schottky field emission electron gun
Sample Chamber	Low-vacuum mode, up to 180 Pa
Camera	Dual cameras (optical navigation + in-bin monitoring)
Objective Lens	Advanced Composite Lens Design
Stage	5-axis Motorized Control X: 110 mm (X-Axis Travel) Y: 110 mm (X-Axis Travel) Z: 1 to 60 mm (X-Axis Travel) T: -5° to 70° (Tilt Travel) R: 360° (Rotation Travel)
Sample Capacity	Max Diameter: 260mm Max Height: 70mm
Detector	Secondary Electron Detector (SED) Backscatter Electron Detector (BSED) Low Vacuum Secondary Electron Detector (LVSED)
Deceleration Technology	Dual deceleration technology (Duo-Dec) Super deceleration technology
Navigation	Optical navigation, gesture quick navigation
Automatic Functions	Auto brightness/contrast, autofocus, auto astigmatism
Dimension	1200 × 1200 × 1800 mm
Packaging Dimension	1400 × 1400 × 2300 mm
Net Weight	1200 kg
Gross Weight	2200 kg

Features

Composite objective lens design
Low-vacuum mode for non-conductive samples
Dual EDS detectors for elemental and crystallographic analysis
Field analysis for real-world conditions

Standard Accessories

9 Holes Standard Tray I for standard samples × 1pc

9 Holes Standard Tray II for sample height 5mm × 1pc

9 Holes Standard Tray III for sample height 14mm × 1pc

Standard Tray VI for sample height 20mm × 1pc

Standard Tray IV (8 Holes) × 1pc

6 Inches Wafer Tray V × 1pc

70 Degree Trays VII × 1pc

19 Holes Tray VIII × 1pc

Optional Accessories

4 inches Sample Change Cabinet

8 inches Sample Change Cabinet

Trajectory Control Ball

Rotary Control Board

SDK Software Development Pack

Applications

Scanning Electron Microscope LB-10SEM is used for high-resolution imaging in fields like nanotechnology, materials science, biology, and semiconductor analysis. It helps examine surface topography, elemental composition, and microstructures in various industries.

Software Features

AutoMap Control Software
Substrates Particles Mask-RCNN Analyst Software
ImageTech Post-processing Software
Auto Measure Measuring Software