Inductively Coupled Plasma Mass Spectrometer LB-10ICPMS provides a mass range from 2 to 260 amu for precise analysis of trace elements. It utilizes argon plasma to ionize samples, ensuring high ionization efficiency. It features an ETP detector and hexapole cell, ensuring accurate trace analysis by removing polyatomic interferences. Our spectrometer facilitates automated PC-controlled counting and stable plasma operation for high-sensitivity analysis.
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Mass Range | 2 to 260 amu |
Testing Range | ≥ 108 |
Sensitivity | Be ≥ 2 × 10⁶ (cps/mg/L) In ≥ 35 × 10⁶ (cps/mg/L) U ≥ 30 × 10⁶ (cps/mg/L) |
Detection Limit | Be ≤ 10 In ≤ 2 U ≤ 2 (ng/L) |
Resolution | 0.6 to 0.8 amu |
Isotope Ratio | ≤ 0.3% (107Ag/109Ag) |
SNR | ≥ 50 × 10⁶ (Signal-to-Noise Ratio) |
Quality Axis Stability | ≤ 0.05 amu/24 h |
Stability RSD | Short term ≤ 3% Long term ≤ 4% |
Oxide Ion | ≤ 3% |
Double Charged Ion | ≤ 3% |
Background Noise | ≤ 2 cps (full quality range) |
Abundance Sensitivity | ≤ 1 × 10⁻⁶ (low-quality end) ≤ 5 × 10⁻⁷ (high quality end) |
Plasma Ion Source | Argon plasma |
Collision Cell | Hexapole collision cell |
Detector | Electron multiplier - ETP double-mode detector, electron multiplier with dynodes arranged in two parts |
Mass Spectrometer Unit | Quadrupole mass spectrometer |
Autosampler | Total: 250 cups, 50mL (10) + 15mL (240) |
Gas Used | He/H2 and He/NH3 at 0 to 10mL/min |
Sample Spray Chamber | Impact bead chamber (electronically cooled), quartz |
Peristaltic Pump | 3-channel |
Plasma Torch | One-piece quartz torch, 1.5mm injector |
Vacuum System | 3 stages, with isolated turbopumps |
Counting and Analog Switch | PC controlled |
Chiller Connection Kit | Yes |
High-Frequency Output | 1.6KW |
High-Frequency Power Supply | 27 MHz, Solid state |
Cooling Water | Single-phase 200 to 230 V, 50/60 Hz, 2 kW |
Power Supply | Single-phase 200 to 240 V ± 10%, 50/60 Hz, 6 Kw |
Dimension | 1300 × 700 × 800 mm |
Gross Weight | 400 kg |
Features
Applications
Inductively Coupled Plasma Mass Spectrometer LB-10ICPMS is ideal for detecting trace elements, conducting food safety testing, and analyzing ultra-trace impurities in semiconductor materials. It also plays a crucial role in medical diagnostics and nuclear monitoring of radioactive elements.
Standard Accessories
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Analysis Range | 1ppm to 99.99% |
Temperature Range | -20℃ to +50℃ |
Measurement Range | From Si to U |
Testing Samples | Solid, liquid and powders |
Analysis Range | 0.5 ppm to 20% |
Working Temperature | 0 to 40℃ |
Test Elements | Sulfur, Chlorine |
Detection Limit | 0.5ppm |
Energy range | 1 keV - 50 keV |
Analysis range | 1 ppm - 99.99 % |
Resolution of imported electrical refrigeration semiconductor detector | 130 ev |
Tube voltage: 0-50Kv tube current | 1 μA ̴ 2000 μA |
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Elemental Analysis Range | From Na to U |
Analytical range | 1 ppm to 99.99% |
Operating temperature | 15 to 30 ℃ |
Relative humidity | 40% to 50% |
Elemental Analysis Range | Fluorine (F) to Uranium (U) |
Temperature Range | 15°C to 30°C |
Analytical Range | ppm to 99.99% |
Detection Limit | As low as 0.2 ppm (for light matrices) |
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Analysis wave band(width range) | 120 nm ̴ 800 nm |
Optical system(large focal length) | Curvature radius : 750 mm |
Optical room | 35 °C ± 0.2 °C |
Working temperature | 10 ° C ̴ 30 ° C |
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Wave Number Range | 7800 to 375 cm-1 |
Resolution | 1 cm-1 |
Wave Number Repeatability | 1 cm-1 |
Wave Number Accuracy | 0.01 cm-1 |
Spectral range | 4000 cm -1 ~ 400 cm-1 |
Light source | Air cooled IR light source |
Signal noise ratio | 15000 : 1 |
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Wavelength range | 200 nm ̴ 560 nm |
Degree of vacuum | |
Pixel resolution | 30 pm |
Spectrum Width | 18 mm |
Wavelength range | 130 nm ̴ 800 nm |
Degree of vacuum | Auto control within 6 pa ̴ 20 pa |
Pixel resolution | 30 pm |
Spectrum Width |
Wavelength range | 130 nm ̴ 800 nm |
Degree of vacuum | Auto control within 6 pa ̴ 20 pa |
Pixel resolution | 30 pm |
Spectrum Width |
Wavelength range | 130 nm ̴ 800 nm |
Degree of vacuum | |
Pixel resolution | |
Spectrum Width |
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