Energy Dispersive X-Ray Fluorescence Spectrometer LB-10EDX

Energy Dispersive X-Ray Fluorescence Spectrometer LB-10EDX

Energy Dispersive X-Ray Fluorescence Spectrometer LB-10EDX is a high-speed digital processing analyzer offering an elemental analysis ranging from Fluorine (F) to Uranium (U). It comes with an analytical range of 0 to 99.99 % with an accuracy of <0.05%. It is a multi-sample chamber system utilizing Siemens PLC control for enhanced efficiency of sample analysis. Integrates a semiconductor SDD detector featuring an ultra-thin window and electrical cooling for precise analysis.

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Specifications

Elemental Analysis Range Fluorine (F) to Uranium (U)
Temperature Range 15°C to 30°C
Analytical Range ppm to 99.99%
Detection Limit As low as 0.2 ppm (for light matrices)
Accuracy <0.05%
Testing Atmosphere Atmospheric, Vacuum, Helium
Detector Energy Resolution SDD detector, ≤129eV
Tube Voltage 5 to 50 kV
Tube Current 0 to 1000 uA
Sample Introduction System 9 sample chambers (with cup rotation)
12 sample chambers + single chamber
20 sample chambers + single chamber (optional)
Sample Chamber Size Φ340 × 64 (H) mm
Power AC 220V ± 5V
Dimension (W × D × H) 646 × 578 × 388 mm
Weight 85 Kg

Features

  • Sample spinning system
  • Equipped with electromagnetic lock
  • Reminder for software misoperations
  • Three-fold security protection system
  • Matrix effect correction model for precise measurements
  • Multivariate nonlinear regression program
  • High voltage generator
  • Cost-effective and user friendly

Applications

It finds applications in analysis of harmful elements, geological and mineral products and composition of alloys. Used in measuring metal coating thickness, determining plating solution and employed in detection of precious metals like as gold, platinum, silver.

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Energy Dispersive X-Ray Fluorescence Spectrometer

Energy Dispersive X-Ray Fluorescence Spectrometer : Energy Dispersive X-Ray Fluorescence Spectrometer LB-20EDX
Elemental Analysis Range From Na to U
Analytical range 1 ppm to 99.99%
Operating temperature 15 to 30 ℃
Relative humidity 40% to 50%

Labotronics Optical Emission Spectrometer (OES) is a sophisticated analytical instrument utilized for elemental analysis in diverse materials. Operating on the principle of inducing plasma through electrical discharges, OES spectrometers measure the characteristic emission lines of excited atoms. This enables the identification and quantification of elements present in a sample based on their unique spectral fingerprints. Widely employed in metallurgy, material science, and quality control, OES spectrometers offer rapid and precise elemental analysis of metals and alloys, providing valuable insights into composition and purity. With its high sensitivity and capability to analyze multiple elements simultaneously, OES spectrometry plays a pivotal role in ensuring the quality and compliance of materials in various industrial and research applications.

Wavelength range 200 nm ̴ 560 nm
Degree of vacuum
Pixel resolution 30 pm
Spectrum Width 18 mm
Wavelength range 130 nm ̴ 800 nm
Degree of vacuum
Pixel resolution
Spectrum Width
Wavelength range 130 nm ̴ 800 nm
Degree of vacuum Auto control within 6 pa ̴ 20 pa
Pixel resolution 30 pm
Spectrum Width
Wavelength range 130 nm ̴ 800 nm
Degree of vacuum Auto control within 6 pa ̴ 20 pa
Pixel resolution 30 pm
Spectrum Width

Our Inductively Coupled Plasma Mass Spectrometry (ICP-MS) is designed for precise and reliable trace element analysis across a wide range of applications. They use argon plasma for ionization, enabling ultra-trace detection in complex samples. They feature a highly sensitive ETP double-mode detector for accurate measurements. Their stable calibration and high resolution ensure accurate, repeatable results. The key features include ultra-trace detection, flexible sampling options, and advanced signal processing. Our Spectrometry features PC-controlled automation for precise trace element analysis in nuclear monitoring and material science research.

Mass Range 2 to 260 amu
Testing Range ≥ 108
Sensitivity Be ≥ 2 × 10⁶ (cps/mg/L) In ≥ 35 × 10⁶ (cps/mg/L) U ≥ 30 × 10⁶ (cps/mg/L)
Detection Limit Be ≤ 10 In ≤ 2 U ≤ 2 (ng/L)

Our Raman Spectrometers operate under controlled temperature conditions for precise analysis in various environments. These spectrometers are equipped with high-sensitivity detectors such as CCDs and photodiode arrays. They achieve ultra-high resolution by precisely focusing the laser spots on the samples. They feature optimized excitation wavelengths, automatic focusing, and auto-scan functionality. These are integrated with confocal optics and provide exceptional spatial resolution for high-precision analysis.

Excitation Wavelength 785 nm
Spectral Range 250 to 4300 cm⁻1
Spectral Resolution 8 to 11 cm⁻1
Maximum Laser Power 500 mW (Power for 532 nm: 100 mW)
Excitation Wavelength 785 nm
Spectral Range 250 to 2700 cmˉ¹
Spectral Resolution 5 cmˉ¹
Maximum Laser Power 500 mW (Power for 532 nm: 100 mW)
Excitation Wavelength 785 nm
Spectral Range 250 to 3500 cmˉ¹
Spectral Resolution 6 to 8 cmˉ¹
Maximum Laser Power 500 mW (Power for 532 nm: 100 mW)

The ICP (Inductively Coupled Plasma) Spectrometer is a sophisticated analytical instrument used for elemental analysis in diverse samples. By employing high-temperature plasma to ionize and excite atoms in a sample, the ICP spectrometer enables the precise measurement of emission or absorption lines characteristic of different elements. Widely utilized in fields such as environmental monitoring, geology, and metallurgy, ICP spectrometers offer exceptional sensitivity and multi-element capability, providing valuable insights into the composition of complex materials with applications in research, quality control, and compliance testing.

Oscillation frequency 27.12 MHz
Gas Nitrogen/Argon
Torch position Electrically adjusted
Torch position optimization Automatic by software
Wavelength range 180 nm ̴̴ 900 nm
Analytical speed 10 elements every minute
Accuracy Relative standard deviation RSD ≤ 2 %
Stability Relative standard deviation RSD ≤ 3 %

Our FTIR (Fourier Transform Infrared) Spectrometer is a powerful analytical instrument used for identifying and analyzing chemical compounds based on their infrared absorption characteristics. Operating on the principle of interferometry, this spectrometer measures the intensity of infrared light absorbed by a sample as a function of wavelength. Widely utilized in research, pharmaceuticals, environmental analysis, and material science, FTIR spectrometers offer high sensitivity and precision, making them indispensable tools for qualitative and quantitative analysis in various scientific disciplines.

Wave Number Range 7800 to 375 cm-1
Resolution 1 cm-1
Wave Number Repeatability 1 cm-1
Wave Number Accuracy 0.01 cm-1
Spectral range 4000 cm -1 ~ 400 cm-1
Light source Air cooled IR light source
Signal noise ratio 15000 : 1
Resolution 1.5 cm -1
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