Energy Dispersive X-Ray Fluorescence Spectrometer LB-10EDX is a high-speed digital processing analyzer offering an elemental analysis ranging from Fluorine (F) to Uranium (U). It comes with an analytical range of 0 to 99.99 % with an accuracy of <0.05%. It is a multi-sample chamber system utilizing Siemens PLC control for enhanced efficiency of sample analysis. Integrates a semiconductor SDD detector featuring an ultra-thin window and electrical cooling for precise analysis.
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Elemental Analysis Range | Fluorine (F) to Uranium (U) |
Temperature Range | 15°C to 30°C |
Analytical Range | ppm to 99.99% |
Detection Limit | As low as 0.2 ppm (for light matrices) |
Accuracy | <0.05% |
Testing Atmosphere | Atmospheric, Vacuum, Helium |
Detector Energy Resolution | SDD detector, ≤129eV |
Tube Voltage | 5 to 50 kV |
Tube Current | 0 to 1000 uA |
Sample Introduction System | 9 sample chambers (with cup rotation) 12 sample chambers + single chamber 20 sample chambers + single chamber (optional) |
Sample Chamber Size | Φ340 × 64 (H) mm |
Power | AC 220V ± 5V |
Dimension (W × D × H) | 646 × 578 × 388 mm |
Weight | 85 Kg |
Features
Applications
It finds applications in analysis of harmful elements, geological and mineral products and composition of alloys. Used in measuring metal coating thickness, determining plating solution and employed in detection of precious metals like as gold, platinum, silver.
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Elemental Analysis Range | From Na to U |
Analytical range | 1 ppm to 99.99% |
Operating temperature | 15 to 30 ℃ |
Relative humidity | 40% to 50% |
Labotronics Optical Emission Spectrometer (OES) is a sophisticated analytical instrument utilized for elemental analysis in diverse materials. Operating on the principle of inducing plasma through electrical discharges, OES spectrometers measure the characteristic emission lines of excited atoms. This enables the identification and quantification of elements present in a sample based on their unique spectral fingerprints. Widely employed in metallurgy, material science, and quality control, OES spectrometers offer rapid and precise elemental analysis of metals and alloys, providing valuable insights into composition and purity. With its high sensitivity and capability to analyze multiple elements simultaneously, OES spectrometry plays a pivotal role in ensuring the quality and compliance of materials in various industrial and research applications.
Wavelength range | 200 nm ̴ 560 nm |
Degree of vacuum | |
Pixel resolution | 30 pm |
Spectrum Width | 18 mm |
Wavelength range | 130 nm ̴ 800 nm |
Degree of vacuum | |
Pixel resolution | |
Spectrum Width |
Wavelength range | 130 nm ̴ 800 nm |
Degree of vacuum | Auto control within 6 pa ̴ 20 pa |
Pixel resolution | 30 pm |
Spectrum Width |
Wavelength range | 130 nm ̴ 800 nm |
Degree of vacuum | Auto control within 6 pa ̴ 20 pa |
Pixel resolution | 30 pm |
Spectrum Width |
Our Inductively Coupled Plasma Mass Spectrometry (ICP-MS) is designed for precise and reliable trace element analysis across a wide range of applications. They use argon plasma for ionization, enabling ultra-trace detection in complex samples. They feature a highly sensitive ETP double-mode detector for accurate measurements. Their stable calibration and high resolution ensure accurate, repeatable results. The key features include ultra-trace detection, flexible sampling options, and advanced signal processing. Our Spectrometry features PC-controlled automation for precise trace element analysis in nuclear monitoring and material science research.
Mass Range | 2 to 260 amu |
Testing Range | ≥ 108 |
Sensitivity | Be ≥ 2 × 10⁶ (cps/mg/L) In ≥ 35 × 10⁶ (cps/mg/L) U ≥ 30 × 10⁶ (cps/mg/L) |
Detection Limit | Be ≤ 10 In ≤ 2 U ≤ 2 (ng/L) |
Our Raman Spectrometers operate under controlled temperature conditions for precise analysis in various environments. These spectrometers are equipped with high-sensitivity detectors such as CCDs and photodiode arrays. They achieve ultra-high resolution by precisely focusing the laser spots on the samples. They feature optimized excitation wavelengths, automatic focusing, and auto-scan functionality. These are integrated with confocal optics and provide exceptional spatial resolution for high-precision analysis.
Excitation Wavelength | 785 nm |
Spectral Range | 250 to 4300 cm⁻1 |
Spectral Resolution | 8 to 11 cm⁻1 |
Maximum Laser Power | 500 mW (Power for 532 nm: 100 mW) |
Excitation Wavelength | 785 nm |
Spectral Range | 250 to 2700 cmˉ¹ |
Spectral Resolution | 5 cmˉ¹ |
Maximum Laser Power | 500 mW (Power for 532 nm: 100 mW) |
Excitation Wavelength | 785 nm |
Spectral Range | 250 to 3500 cmˉ¹ |
Spectral Resolution | 6 to 8 cmˉ¹ |
Maximum Laser Power | 500 mW (Power for 532 nm: 100 mW) |
The ICP (Inductively Coupled Plasma) Spectrometer is a sophisticated analytical instrument used for elemental analysis in diverse samples. By employing high-temperature plasma to ionize and excite atoms in a sample, the ICP spectrometer enables the precise measurement of emission or absorption lines characteristic of different elements. Widely utilized in fields such as environmental monitoring, geology, and metallurgy, ICP spectrometers offer exceptional sensitivity and multi-element capability, providing valuable insights into the composition of complex materials with applications in research, quality control, and compliance testing.
Oscillation frequency | 27.12 MHz |
Gas | Nitrogen/Argon |
Torch position | Electrically adjusted |
Torch position optimization | Automatic by software |
Wavelength range | 180 nm ̴̴ 900 nm |
Analytical speed | 10 elements every minute |
Accuracy | Relative standard deviation RSD ≤ 2 % |
Stability | Relative standard deviation RSD ≤ 3 % |
Our FTIR (Fourier Transform Infrared) Spectrometer is a powerful analytical instrument used for identifying and analyzing chemical compounds based on their infrared absorption characteristics. Operating on the principle of interferometry, this spectrometer measures the intensity of infrared light absorbed by a sample as a function of wavelength. Widely utilized in research, pharmaceuticals, environmental analysis, and material science, FTIR spectrometers offer high sensitivity and precision, making them indispensable tools for qualitative and quantitative analysis in various scientific disciplines.
Wave Number Range | 7800 to 375 cm-1 |
Resolution | 1 cm-1 |
Wave Number Repeatability | 1 cm-1 |
Wave Number Accuracy | 0.01 cm-1 |
Spectral range | 4000 cm -1 ~ 400 cm-1 |
Light source | Air cooled IR light source |
Signal noise ratio | 15000 : 1 |
Resolution | 1.5 cm -1 |
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