Energy Dispersive X-Ray Fluorescence Spectrometer LB-20EDX is an advanced testing system for environment compliance testing. Within the range of 1 ppm to 99.99%, it offers an elemental analysis spanning from Na to U. The device uses a vacuumizer to ensure better response to environmental directives. Integrated SDD testing system improves accuracy of the detection. Streamlined body with the Si-pin detector elevates data analysis accuracy.
Buy Now Download CatalogSpecifications
Elemental Analysis Range | From Na to U |
Analytical range | 1 ppm to 99.99% |
Operating temperature | 15 to 30 ℃ |
Relative humidity | 40% to 50% |
Measuring time | 100 to 300 seconds (Adjustable) |
ROHS directive rules | Limited detection up to 1 ppm |
Energy resolution | 149 ± 5 EV |
SDD Electrical Cooled Detector distinguishability | 129 ± 5 e electron volt |
Filament Current Maximum Output | 1 Ma |
Half Loss Component | Service life > 20,000 hours |
Maximum Output Voltage | 50 kV |
Vacuum Pumping System | Low vibration, low noise, self-protection, fast pumping speed |
Geometric Pumping Speed of vacuum system | 60 L/min |
Ultimate Pressure of vacuum system | 6.7 × 10^ -2 Pa |
Power Supply | AC 220 V ± 5 V |
Packaging Dimension | 580 × 550 × 400 mm |
Weight | 80 Kg |
Features
Applications
Energy Dispersive X-Ray Fluorescence Spectrometer is used environmental compliance testing across electronics manufacturing, production, recycling and waste management, automotive industries, etc.
What our customers say
Denziel D'souza
2 weeks ago
Sir/Ma'am .
5 months ago
Add a review
Elemental Analysis Range | Fluorine (F) to Uranium (U) |
Temperature Range | 15°C to 30°C |
Analytical Range | ppm to 99.99% |
Detection Limit | As low as 0.2 ppm (for light matrices) |
Our Raman Spectrometers operate under controlled temperature conditions for precise analysis in various environments. These spectrometers are equipped with high-sensitivity detectors such as CCDs and photodiode arrays. They achieve ultra-high resolution by precisely focusing the laser spots on the samples. They feature optimized excitation wavelengths, automatic focusing, and auto-scan functionality. These are integrated with confocal optics and provide exceptional spatial resolution for high-precision analysis.
Excitation Wavelength | 785 nm |
Spectral Range | 250 to 3500 cmˉ¹ |
Spectral Resolution | 6 to 8 cmˉ¹ |
Maximum Laser Power | 500 mW (Power for 532 nm: 100 mW) |
Excitation Wavelength | 785 nm |
Spectral Range | 250 to 4300 cm⁻1 |
Spectral Resolution | 8 to 11 cm⁻1 |
Maximum Laser Power | 500 mW (Power for 532 nm: 100 mW) |
Excitation Wavelength | 785 nm |
Spectral Range | 250 to 2700 cmˉ¹ |
Spectral Resolution | 5 cmˉ¹ |
Maximum Laser Power | 500 mW (Power for 532 nm: 100 mW) |
We provide an X-ray Fluorescence (XRF) Spectrometer, a powerful analytical instrument used for non-destructive elemental analysis of various materials. Operating on the principle of X-ray excitation, the spectrometer measures the characteristic X-ray fluorescence emitted by elements in a sample. It provides rapid and quantitative information about the elemental composition across a wide range of materials, including metals, minerals, and alloys. Widely used in fields such as geology, environmental science, and quality control, XRF spectrometers offer high precision and accuracy, enabling users to identify and quantify elements with minimal sample preparation.
Analysis Range | 1ppm to 99.99% |
Temperature Range | -20℃ to +50℃ |
Measurement Range | From Si to U |
Testing Samples | Solid, liquid and powders |
Analysis Range | 0.5 ppm to 20% |
Working Temperature | 0 to 40℃ |
Test Elements | Sulfur, Chlorine |
Detection Limit | 0.5ppm |
Energy range | 1 keV - 50 keV |
Analysis range | 1 ppm - 99.99 % |
Resolution of imported electrical refrigeration semiconductor detector | 130 ev |
Tube voltage: 0-50Kv tube current | 1 μA ̴ 2000 μA |
Our Inductively Coupled Plasma Mass Spectrometry (ICP-MS) is designed for precise and reliable trace element analysis across a wide range of applications. They use argon plasma for ionization, enabling ultra-trace detection in complex samples. They feature a highly sensitive ETP double-mode detector for accurate measurements. Their stable calibration and high resolution ensure accurate, repeatable results. The key features include ultra-trace detection, flexible sampling options, and advanced signal processing. Our Spectrometry features PC-controlled automation for precise trace element analysis in nuclear monitoring and material science research.
Mass Range | 2 to 260 amu |
Testing Range | ≥ 108 |
Sensitivity | Be ≥ 2 × 10⁶ (cps/mg/L) In ≥ 35 × 10⁶ (cps/mg/L) U ≥ 30 × 10⁶ (cps/mg/L) |
Detection Limit | Be ≤ 10 In ≤ 2 U ≤ 2 (ng/L) |
Our FTIR (Fourier Transform Infrared) Spectrometer is a powerful analytical instrument used for identifying and analyzing chemical compounds based on their infrared absorption characteristics. Operating on the principle of interferometry, this spectrometer measures the intensity of infrared light absorbed by a sample as a function of wavelength. Widely utilized in research, pharmaceuticals, environmental analysis, and material science, FTIR spectrometers offer high sensitivity and precision, making them indispensable tools for qualitative and quantitative analysis in various scientific disciplines.
Wave Number Range | 7800 to 375 cm-1 |
Resolution | 1 cm-1 |
Wave Number Repeatability | 1 cm-1 |
Wave Number Accuracy | 0.01 cm-1 |
Spectral range | 4000 cm -1 ~ 400 cm-1 |
Light source | Air cooled IR light source |
Signal noise ratio | 15000 : 1 |
Resolution | 1.5 cm -1 |
The ICP (Inductively Coupled Plasma) Spectrometer is a sophisticated analytical instrument used for elemental analysis in diverse samples. By employing high-temperature plasma to ionize and excite atoms in a sample, the ICP spectrometer enables the precise measurement of emission or absorption lines characteristic of different elements. Widely utilized in fields such as environmental monitoring, geology, and metallurgy, ICP spectrometers offer exceptional sensitivity and multi-element capability, providing valuable insights into the composition of complex materials with applications in research, quality control, and compliance testing.
Wavelength range | 180 nm ̴̴ 900 nm |
Analytical speed | 10 elements every minute |
Accuracy | Relative standard deviation RSD ≤ 2 % |
Stability | Relative standard deviation RSD ≤ 3 % |
Oscillation frequency | 27.12 MHz |
Gas | Nitrogen/Argon |
Torch position | Electrically adjusted |
Torch position optimization | Automatic by software |
Categories
Best Seller