Optical emission spectrometer LB-11OES

Optical emission spectrometer LB-11OES

Optical emission spectrometer LB-11OES is a tabletop high performance spectrometer with a wavelength range of 130 nm to 800 nm. Low operating cost for metal analysis and saves energy by 50%. Based on CMOS technology and contains full spectrum characteristics of CCD spectrometer with extremely low detection limit for non-metallic elements.

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Specifications

Wavelength range 130 nm ̴ 800 nm
Focal length 400 mm
Grating line 2400 m1 / mm
First order spectral line dispersion rare 1.2 nm / mm
Average resolution ratio 10 pm / pixel
Spark frequency 100 Hz ̴ 1000 Hz
Discharge current 1 A – 400 A
Power AC 220 V 50 Hz AC 220 V 60 Hz
Power consumption Maximum : 750 W Standby : 40 W
Argon quality 99.999 %, Argon pressure > 4 Mpa
Argon consumption 4L / min during spark mode
Working temperature 10 °C - 35 °C (Temperature ≥ 5 °C)
Working humidity 20 % – 85 %
Dimension 860 x 680 x 438 mm
Weight 100 kgs

Features

  • CCD-based, spark discharge OES
  • Direct reading system
  • Digital light for ultra-high resolution
  • High-stability output rate of plasma
  • The analytical base is Fe base
  • Customizable bases of Al, Cu, Zn, Fe and Cu, Fe, Cu and Al are available
  • Flexible sample clamp design and on-site analysis of samples

Applications

Used for metal and trace elemental analysis, foundry, mechanical engineering, scientific research, product inspection, automobile, petrochemical engineering, shipbuilding, electrics, aerospace, nuclear power, metallic and nonferrous metallic smelting, processing and recycling.

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OES Spectrometer

OES Spectrometer : Optical emission spectrometer LB-13OES
Wavelength range 130 nm ̴ 800 nm
Degree of vacuum Auto control within 6 pa ̴ 20 pa
Pixel resolution 30 pm
Spectrum Width
OES Spectrometer : Optical emission spectrometer LB-10OES
Wavelength range 130 nm ̴ 800 nm
Degree of vacuum Auto control within 6 pa ̴ 20 pa
Pixel resolution 30 pm
Spectrum Width
OES Spectrometer : Optical emission spectrometer LB-12OES
Wavelength range 200 nm ̴ 560 nm
Degree of vacuum
Pixel resolution 30 pm
Spectrum Width 18 mm

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Elemental Analysis Range From Na to U
Analytical range 1 ppm to 99.99%
Operating temperature 15 to 30 ℃
Relative humidity 40% to 50%
Elemental Analysis Range Fluorine (F) to Uranium (U)
Temperature Range 15°C to 30°C
Analytical Range ppm to 99.99%
Detection Limit As low as 0.2 ppm (for light matrices)

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Analysis wave band(width range) 120 nm ̴ 800 nm
Optical system(large focal length) Curvature radius : 750 mm
Optical room 35 °C  ± 0.2 °C
Working temperature 10 ° C ̴ 30 ° C 

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Wavelength range 180 nm ̴̴ 900 nm
Analytical speed 10 elements every minute
Accuracy Relative standard deviation RSD ≤ 2 %
Stability Relative standard deviation RSD ≤ 3 %
Oscillation frequency 27.12 MHz
Gas Nitrogen/Argon
Torch position Electrically adjusted
Torch position optimization Automatic by software

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Wave Number Range 7800 to 375 cm-1
Resolution 1 cm-1
Wave Number Repeatability 1 cm-1
Wave Number Accuracy 0.01 cm-1
Spectral range 4000 cm -1 ~ 400 cm-1
Light source Air cooled IR light source
Signal noise ratio 15000 : 1
Resolution 1.5 cm -1

We provide an X-ray Fluorescence (XRF) Spectrometer, a powerful analytical instrument used for non-destructive elemental analysis of various materials. Operating on the principle of X-ray excitation, the spectrometer measures the characteristic X-ray fluorescence emitted by elements in a sample. It provides rapid and quantitative information about the elemental composition across a wide range of materials, including metals, minerals, and alloys. Widely used in fields such as geology, environmental science, and quality control, XRF spectrometers offer high precision and accuracy, enabling users to identify and quantify elements with minimal sample preparation.

Energy range 1 keV - 50 keV
Analysis range 1 ppm - 99.99 %
Resolution of imported electrical refrigeration semiconductor detector 130 ev
Tube voltage: 0-50Kv tube current 1 μA ̴ 2000 μA
Analysis Range 0.5 ppm to 20%
Working Temperature 0 to 40℃
Test Elements Sulfur, Chlorine
Detection Limit 0.5ppm
Analysis Range 1ppm to 99.99%
Temperature Range -20℃ to +50℃
Measurement Range From Si to U
Testing Samples Solid, liquid and powders
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