The ICP (Inductively Coupled Plasma) Spectrometer is a sophisticated analytical instrument used for elemental analysis in diverse samples. By employing high-temperature plasma to ionize and excite atoms in a sample, the ICP spectrometer enables the precise measurement of emission or absorption lines characteristic of different elements. Widely utilized in fields such as environmental monitoring, geology, and metallurgy, ICP spectrometers offer exceptional sensitivity and multi-element capability, providing valuable insights into the composition of complex materials with applications in research, quality control, and compliance testing.
| Wavelength range |
180 nm ̴̴ 900 nm |
| Analytical speed |
10 elements every minute |
| Accuracy |
Relative standard deviation RSD ≤ 2 % |
| Stability |
Relative standard deviation RSD ≤ 3 % |
| Oscillation frequency |
27.12 MHz |
| Gas |
Nitrogen/Argon |
| Torch position |
Electrically adjusted |
| Torch position optimization |
Automatic by software |
Our Photomultiplier tube (PMT) spectrometers are advanced optical instruments used for sensitive and precise detection of light signals across different wavelengths. Employing a photomultiplier to amplify weak light signals, these spectrometers excel in applications requiring high sensitivity, such as fluorescence spectroscopy, Raman spectroscopy, and low-light-level measurements. PMT spectrometers convert incoming photons into electrical signals, offering excellent signal-to-noise ratios and wide dynamic ranges. Their versatility makes them essential in scientific research, biomedical diagnostics, and environmental monitoring, where the ability to detect and analyze faint light signals is crucial.
| Analysis wave band(width range) |
120 nm ̴ 800 nm |
| Optical system(large focal length) |
Curvature radius : 750 mm |
| Optical room |
35 °C ± 0.2 °C |
| Working temperature |
10 ° C ̴ 30 ° C |
We provide an X-ray Fluorescence (XRF) Spectrometer, a powerful analytical instrument used for non-destructive elemental analysis of various materials. Operating on the principle of X-ray excitation, the spectrometer measures the characteristic X-ray fluorescence emitted by elements in a sample. It provides rapid and quantitative information about the elemental composition across a wide range of materials, including metals, minerals, and alloys. Widely used in fields such as geology, environmental science, and quality control, XRF spectrometers offer high precision and accuracy, enabling users to identify and quantify elements with minimal sample preparation.
| Energy range |
1 keV - 50 keV |
| Analysis range |
1 ppm - 99.99 % |
| Resolution of imported electrical refrigeration semiconductor detector |
130 ev |
| Tube voltage: 0-50Kv tube current |
1 μA ̴ 2000 μA |
| Analysis Range |
0.5 ppm to 20% |
| Working Temperature |
0 to 40℃ |
| Test Elements |
Sulfur, Chlorine |
| Detection Limit |
0.5ppm |
| Analysis Range |
1ppm to 99.99% |
| Temperature Range |
-20℃ to +50℃ |
| Measurement Range |
From Si to U |
| Testing Samples |
Solid, liquid and powders |
Our FTIR (Fourier Transform Infrared) Spectrometer is a powerful analytical instrument used for identifying and analyzing chemical compounds based on their infrared absorption characteristics. Operating on the principle of interferometry, this spectrometer measures the intensity of infrared light absorbed by a sample as a function of wavelength. Widely utilized in research, pharmaceuticals, environmental analysis, and material science, FTIR spectrometers offer high sensitivity and precision, making them indispensable tools for qualitative and quantitative analysis in various scientific disciplines.
| Spectral range |
4000 cm -1 ~ 400 cm-1 |
| Light source |
Air cooled IR light source |
| Signal noise ratio |
15000 : 1 |
| Resolution |
1.5 cm -1 |
| Wave Number Range |
7800 to 375 cm-1 |
| Resolution |
1 cm-1 |
| Wave Number Repeatability |
1 cm-1 |
| Wave Number Accuracy |
0.01 cm-1 |
Our Inductively Coupled Plasma Mass Spectrometry (ICP-MS) is designed for precise and reliable trace element analysis across a wide range of applications. They use argon plasma for ionization, enabling ultra-trace detection in complex samples. They feature a highly sensitive ETP double-mode detector for accurate measurements. Their stable calibration and high resolution ensure accurate, repeatable results. The key features include ultra-trace detection, flexible sampling options, and advanced signal processing. Our Spectrometry features PC-controlled automation for precise trace element analysis in nuclear monitoring and material science research.
| Mass Range |
2 to 260 amu |
| Testing Range |
≥ 108 |
| Sensitivity |
Be ≥ 2 × 10⁶ (cps/mg/L)
In ≥ 35 × 10⁶ (cps/mg/L)
U ≥ 30 × 10⁶ (cps/mg/L) |
| Detection Limit |
Be ≤ 10
In ≤ 2
U ≤ 2 (ng/L) |
Labotronics Energy Dispersive X-Ray Fluorescence Spectrometer provides analysis of elements from light to heavy with minimal preparation. Its easy software ensures a smooth, hassle-free analytical process. Our spectrometer's durable design ensures reliability and reduces maintenance. Offers versatile analysis of multiple materials, revealing detailed composition and purity insights. It guarantees safety, meets standards, and minimizes radiation, all while delivering high performance.
| Elemental Analysis Range |
From Na to U |
| Analytical range |
1 ppm to 99.99% |
| Operating temperature |
15 to 30 ℃ |
| Relative humidity |
40% to 50% |
| Elemental Analysis Range |
Fluorine (F) to Uranium (U) |
| Temperature Range |
15°C to 30°C |
| Analytical Range |
ppm to 99.99 % |
| Detection Limit |
As low as 0.2 ppm (for light matrices) |
Our Raman Spectrometers operate under controlled temperature conditions for precise analysis in various environments. These spectrometers are equipped with high-sensitivity detectors such as CCDs and photodiode arrays. They achieve ultra-high resolution by precisely focusing the laser spots on the samples. They feature optimized excitation wavelengths, automatic focusing, and auto-scan functionality. These are integrated with confocal optics and provide exceptional spatial resolution for high-precision analysis.
| Excitation Wavelength |
785 nm |
| Spectral Range |
250 to 4300 cm⁻1 |
| Spectral Resolution |
8 to 11 cm⁻1 |
| Maximum Laser Power |
500 mW (Power for 532 nm: 100 mW) |
| Excitation Wavelength |
785 nm |
| Spectral Range |
250 to 2700 cmˉ¹ |
| Spectral Resolution |
5 cmˉ¹ |
| Maximum Laser Power |
500 mW (Power for 532 nm: 100 mW) |
| Excitation Wavelength |
785 nm |
| Spectral Range |
250 to 3500 cmˉ¹ |
| Spectral Resolution |
6 to 8 cmˉ¹ |
| Maximum Laser Power |
500 mW (Power for 532 nm: 100 mW) |
| Spectral Range |
200 to 4000 cm⁻¹ |
| Excitation Wavelength |
785 ± 0.5nm |
| Resolution |
10 cm⁻¹ |
| Temperature Range |
-20 to 50 ℃ |
