| Light source | Semi-conductor laser |
| Particle size range | 0.8 to 600 µm |
| Detection channel | 16 channels |
| Sensitivity | 0.8 µm or 3 µm |
| Resolution | <10% |
| Light source | Semi-conductor laser |
| Particle size range | 0.8 to 500 µm |
| Detection channel | 8 channels |
| Resolution | ≤10% |
| Repeatability | RSD < 2% |
| Light source | Semi-conductor laser |
| Particle size range | 1 to 400 µm |
| Detection channels | 16 |
| Sensitivity | 1 µm or 4 µm |
| Resolution | >10% |
| Light Source | Semiconductor laser |
| Particle Size Range | 1-500 μm |
| Offline Detection Speed | 5-60 mL/min |
| Offline Detection Sample Viscosity | ≤100cSt (optional pressure chamber for higher viscosity) |
| On-Line Detection Pressure | 0.1-0.6 Mpa (max 42 Mpa with optional decompression device) |
| Light Source | Semiconductor laser |
| Particle Size Range | 0.8 to 600μm |
| Sensitivity | 0.1μm |
| Test Sample Temperature Range | 0°C to 80°C |
| Operating Temperature Range | -20°C to 60°C |
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